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Cainiao Smart Gateway, situated at the Hong Kong International Airport, serves as a hub of modern logistics technology connecting the Greater Bay Area to global markets. Spanning 12 floors and covering 4.1 million sq ft, it offers a wide range of logistic services. The EL Division organised the captioned technical visit to the Gateway on 6 December 2024, with 23 participants joining the visit.
The visit commenced with an insightful introduction to each floor’s operations, revealing not only the Gateway’s prowess in logistics, but also the presence of well-known companies like DHL and Pinduoduo. They can collaborate with firms on other floors which provide specialist services for aviation-related businesses, thus enhancing delivery efficiency and convenience through seamless cooperation.
Participants were first led to the office, where a detailed model of the entire Gateway was unveiled. The intricate logistics flow was explained through this model, emphasising the importance of efficiency and reliability in catering to customer needs.
After this, participants were led to a viewing platform that highlighted the strategic location near the airport, emphasising the site’s role as a modern logistics hub. Participants were also able to witness the smooth flow of planes arriving and departing, while recognising the neighbouring facilities.
The tour concluded with an onsite demonstration of the German-manufactured intelligent storage system, illustrating its automated goods identification and transfer processes. This system streamlines operations, ensuring safety and efficiency. It also gave the participants insights into the Smart Park and Automated Storage/Retrieval System, showcasing the comprehensive services on offer.
The visit concluded with expressions of gratitude to the Cainiao Smart Gateway team for sharing their insights. The event presented valuable knowledge about innovative logistics solutions and the integration of advanced technologies in the industry. The structured exploration of the Gateway also offered glimpses into the world of efficient logistics and modern technology, showcasing their impact on the industry.
The EL Division organised the captioned seminar on 5 December 2024 to explore this subject matter. Approximately 400 participants attended.
The speaker, Mr Albert Leung from Siemens, first introduced the development and application of AFDD, as well as the essentials of EV protection.
Mr Leung explained that electricity and overheating are major causes of fires and listed the frequently discovered faults in electrical installations. He classified arc faults into three types: parallel faults between live (L) and protective earth (PE), parallel faults between L and L/N (neutral), and serial faults. While parallel faults can be detected by Miniature Circuit Breakers (MCBs), Residual Current Devices (RCDs), or AFDDs, serial faults can only be detected by AFDDs.
Mr Leung described the development of arc faults from damaged cables to the carbonisation of insulation and stable arcing. Arc faults most likely occur in cables carrying currents of 3-10 A. If the current is too weak, the energy is insufficient to ignite the cable. If the current is too strong, the carbonised material vaporises and prevents arcing.
He also illustrated the detection circuitry and logic of AFDDs. Arc faults are characterised by high-frequency currents. The circuit detects both high-frequency and normal load currents. A microcontroller calculates the signal strength of the high frequency and integrates the value over time. When the final value exceeds a threshold, a fault condition is detected.
The second part of the seminar focused on the residual current protection of EV chargers. A protection device must safeguard the circuit from Direct Current (DC) leakage current. If the charger lacks DC leakage protection, a type B or type A device with a DC detection circuit should also be installed.
The seminar concluded with a question-and-answer session. Participants raised questions about AFDDs and EV protection devices. The EL Division would like to express its gratitude to Mr Leung for his informative presentation.